Category: Uncategorized

Thermal stresses of a backlite defroster – Shear 0. Effects of traces not as present in this stress direction, but broad developing thermal stresses are. Difference of cool and heated conditions. Temper pattern removed.

Thermal stresses of a backlite defroster – Shear 45. Compression under defroster trace, tension in-between superimposed with broad developing thermal stresses. Difference of cool and heated conditions. Temper pattern removed.

An interrogable thermal stress image has been extracted from live video for analysis. Shear 45 stress not directly affected by thermal stress state. Difference of cool/heated conditions to see change in stress state. Temper pattern removed.

An interrogable thermal stress image has been extracted from live video for analysis. Shear 0 stress not directly affected by thermal stress state. Difference of cool/heated conditions to see change in stress state. Temper pattern removed.

The GFP™2600 AT Real-time Photoelastic Stress Analysis (PSA) System can be used as a general purpose laboratory tool, but is often incorporated into other Stress Photonics products or custom installations.