GFP™2600 (Grey Field Polariscope)

GFP™2600 Real-time
Grey Field Polariscope

Real-time Photoelastic Stress Analysis Systems

The GFP™2600 Real-time Photoelastic Stress Analysis (PSA) Systems instantaneously acquire stress images, or videos, via kaleidoscopic optics. The systems create multiple copies of stress images—all exposed to different sets of polarizing optics to measure stress in transparent materials, such as; glass, silicon wafers, silicon coated glass and many ceramics. The system can measure stress through painted glass by reflecting light off the paint and can measure load induced surface strains on opaque materials with applied strain sensitive coatings.

 

Each PSA system consists of; a GFP (Grey Field Polariscope) camera head, an illuminator, and framework that ties the system together. Selection of lenses can further customize the systems to measure stress in a broad range of materials.

Full Featured Software - DeltaVision™

The GFP2600 Photoelastic Stress Analysis (PSA) System is managed with easy to use DeltaVision™ software—a versatile tool for capturing, presenting, analyzing and archiving photoelastic data.

DeltaVision Features

Among many other features, the DeltaVision provides:

  • Live Image Monitoring
  • Image Acquisition and Controls
  • Data Interrogation such as Line Plots
  • Reference Image Subtraction
  • Data Smoothing
  • Conversion to Stress Images
Thermal Stress of a Backlite Defroster

GFP2600 System Configurations

Not only is the GFP™2600 Real-time PSA System one of the fastest stress measurement instruments Stress Photonics offers, when paired with specific illuminators, the resulting “configurations” become custom solutions suited to a broad range of applications. The two most popular GFP2600 configurations are shown below.

EdgeMaster™ 2

The EdgeMaster™ 2 is a photoelastic stress analysis system optimized for measuring edge stresses in clear or tinted glass, and glass with or without black paint. The system works on windshields, sidelights, and backlights.

GFP™2600 NIR/SWIR

The GFP™2600 NIR/SWIR Real-time Photoelastic Stress Analysis (PSA) System can be used as a general purpose laboratory tool, but is often incorporated into other Stress Photonics products or custom installations.

GFP™2600 STRIP

The GFP™2600 STRIP Real-time Photoelastic Stress Analysis (PSA) System can be used as a general purpose laboratory tool, but is often incorporated into other Stress Photonics products or custom installations.
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GFP2600 Real-time Strain Analysis

This video demonstrates real-time strain analysis of a 3 Mil LDPE (Low Density Polyethylene) plastic sheet acquired with the GFP2600 PSA (Photoelastic Stress Analysis) System.

This video demonstrates real-time strain analysis of a 3 Mil LDPE (Low Density Polyethylene) plastic sheet acquired with the GFP2600 PSA (Photoelastic Stress Analysis) System.

GFP2600 System Applications

Below is a sampling of GFP™2600 images.

Architectural Glass

Typical data captured with GFP2600 STRIP camera(s) “stitched” together to create large images. Cameras are positioned above a conveyer.

Automotive Backlite Defroster

An interrogable thermal stress image has been extracted from live video for analysis. Shear 45 stress not directly affected by thermal stress state. Difference of cool/heated conditions to see change in stress state. Temper pattern removed.

Automotive Backlite Defroster

An interrogable thermal stress image has been extracted from live video for analysis. Shear 0 stress not directly affected by thermal stress state. Difference of cool/heated conditions to see change in stress state. Temper pattern removed.

Multi Crystalline Si Thermal Stress

The image above was acquired with the GFP™1500. The GFP™2600 NIR/SWIR Stress Measurement System is fully capable of acquiring the same stress image; however, with the GFP2600, image acquisition is instantaneous!

Si Wafer Laser Drilled Holes

Stress from Laser Drilled Holes in Si Wafer. Image acquired with the GFP™1500. The GFP™2600 NIR/SWIR system is fully capable of acquiring the same stress image; however, with the GFP2600, image acquisition is instantaneous!

Crystal Orientation of Si Wafer

Polarization due to crystal orientation of Si wafer. Image acquired with the GFP™1500. The GFP™2600 system is fully capable of acquiring the same stress image; however, with the GFP2600, image acquisition is instantaneous!

Si Wafer Crack

Crack detection via stress in multi crystalline Si wafer. Image acquired with the GFP™1500. The GFP™2600 system is fully capable of acquiring the same stress image; however, with the GFP2600, image acquisition is instantaneous!

Si Disk in Diametral Compression

The image above was acquired with the GFP™1500. The GFP™2600 NIR/SWIR Stress Measurement System is fully capable of acquiring the same stress image; however, with the GFP2600, image acquisition is instantaneous!

Si Wafer Crack

Stress near a crack at the edge of a single crystal Si wafer. The image acquired with the GFP™1500. The GFP™2600 system is fully capable of acquiring the same stress image; however, with the GFP2600, image acquisition is instantaneous!
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GFP2600 Specifications

SPECIFICATIONVALUE
Size76mm w × 105mm h × 60mm d
Range1000nm
Repeatability2%
Accuracy0–10nm ± 0.5nm
10–100nm ± 5nm
100nm ± 5%
Frame Rate10 f/s
ResolutionPixel Resolution: 2750 × 1080
LensesAny C-mount Lens
InterfaceGigE
Specifications are general. Definitive specifications are determined by application and will be reflected in final quote.

Need help? Email our expert support team via our contact form or call us at +1 (608)224-1230

Need help? Email our support
team via our contact form
or call us at +1 (608)224-1230

Glass Photonics was founded by Stress Photonics Inc in order to better serve the glass industry.
All products are manufactured by Stress Photonics.

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